Traceable High Impedance Calibration Standards

被引：0
作者：
Haase, Martin [1 ]
Hoffmann, Karel [1 ]
Hudlicka, Martin [2 ]
机构：
[1] Czech Tech Univ, Prague, Czech Republic
[2] Czech Metrol Inst, Prague, Czech Republic
来源：
2016 87TH ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG) | 2016年
关键词：
Calibration standards; characterization; electromagnetic simulation; microwave measurement; scattering parameters;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The paper deals with S-parameters characterization process of newly developed and fabricated high impedance calibration standards, based on APC-7 microwave connectors, suitable for extreme impedances measurement. It evaluates all critical factors playing significant role in the process including dimension and material characterization and used fabrication technology. A combination of the electromagnetic simulator ANSYS HFSS and precise traceable microwave measurements is used for their final characterization and evaluation of the uncertainty. Finally, some technological solutions which could further improve the characterization uncertainty are proposed.
引用
收藏
页数：4
相关论文
共 9 条
  • [1] [Anonymous], 2007, 287TM2007 IEEE, P50
  • [2] Haase M., 2015, 86 ARFTG MICR MEAS C, P83
  • [3] Haase M., 2014, PROC 83 ARFTG MICROW, P1
  • [4] Haddadi K., 2012, 60 IEEE MTT S INT MI, P1
  • [5] Imtiaz A., 2014, MICROWAVE MAGAZINE I, V15, P52, DOI DOI 10.1109/MMM.2013.2288711
  • [6] Wideband measurement of extreme impedances with a multistate reflectometer
    Lewandowski, Arkadiusz
    LeGolvan, Denis
    Ginley, Ronald A.
    Wallis, T. Mitchell
    Imtiaz, Atif
    Kabos, Pavel
    [J]. 72ND ARFTG MICROWAVE MEASUREMENT SYMPOSIUM: TIME DOMAIN AND FREQUENCY DOMAIN MEASUREMENT, 2008, : 45 - +
  • [7] Mubarak F., 2015, 86 ARFTG MICR MEAS C, P87
  • [8] A Method for Direct Impedance Measurement in Microwave and Millimeter-Wave Bands
    Randus, Martin
    Hoffmann, Karel
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2011, 59 (08) : 2123 - 2130
  • [9] A Simple Method for Extreme Impedances Measurement - Experimental Testing
    Randus, Martin
    Hoffmann, Karel
    [J]. 72ND ARFTG MICROWAVE MEASUREMENT SYMPOSIUM, 2008, : 40 - 44
1