Side Channel Leakage Information Based on Electromagnetic Emission of STM32 Micro-controller

被引：0

作者：

Xu Zhijian ^{[1
]}

Tang Qiang ^{[1
]}

Song Yanyan ^{[1
]}

Zhang Dongyao ^{[1
]}

Zhou Changlin ^{[1
]}

机构：

[1] Strateg Support Force Informat Engn Univ, Zhengzhou, Peoples R China

来源：

2019 12TH INTERNATIONAL WORKSHOP ON THE ELECTROMAGNETIC COMPATIBILITY OF INTEGRATED CIRCUITS (EMC COMPO 2019) | 2019年

基金：

中国国家自然科学基金;

关键词：

Side Channel leakage; information safety; wavelet transform; support vector machine; information reconstruction;

D O I：

10.1109/emccompo.2019.8919716

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper analyses the electromagnetic information conducted leakage mechanism of a typical single-chip micro controller, tests and reconstructs raw information emission by micro-controllers. The direct-coupled signal detection method is used to collect the electromagnetic leakage information of the side channel to obtain the conduction coupling leakage waveform. Using the wavelet transform, feature information of the leakage signal is extracted. And the original information is reconstructed by using Support Vector Machine (SVM). The results show that the chip-level electromagnetic emission leakage is closely related to its working state, and the side channel is used to detect and analyze the leakage signal, which can reconstruct the original information and effectively know its internal working state.

引用

页码：204 / 206

页数：3