Suppression of dark current through barrier engineer for solution-processed colloidal quantum-dots infrared photodetectors

被引:13
|
作者
Jiang, Zhenyu [1 ]
Hu, Wenjia [2 ]
Liu, Yan [1 ]
Zhang, Wenjun [3 ]
Mo, Chen [1 ]
You, Guanjun [3 ]
Wang, Li [1 ]
Atalla, Mahmoud R. M. [1 ]
Zhang, Yu [4 ,5 ]
Liu, Jie [1 ]
Kurhade, Kandhar K. [1 ]
Xu, Jian [1 ]
机构
[1] Penn State Univ, Dept Engn Sci & Mech, University Pk, PA 16802 USA
[2] China Tianchen Engn Corp, Tianjin 300400, Peoples R China
[3] Shanghai Univ Sci & Technol, Shanghai Key Lab Modern Opt Syst, Shanghai 200093, Peoples R China
[4] Jilin Univ, State Key Lab Integrated Optoelect, Changchun 130012, Peoples R China
[5] Jilin Univ, Coll Elect Sci & Engn, Changchun 130012, Peoples R China
基金
美国国家科学基金会;
关键词
TANDEM POLYMER; NANOCRYSTALS; PHOTODIODES; SOLVENT;
D O I
10.1063/1.4930158
中图分类号
O59 [应用物理学];
学科分类号
摘要
In an attempt to suppress the dark current, the barrier layer engineer for solution-processed PbSe colloidal quantum-dot (CQD) photodetectors has been investigated in the present study. It was found that the dark current can be significantly suppressed by implementing two types of carrier blocking layers, namely, hole blocking layer and electron blocking layer, sandwiched in between two active PbSe CQD layers. Meanwhile no adverse impact has been observed for the photo current. Our study suggests that this improvement resides on the transport pathway created via carrier recombination at intermediate layer, which provides wide implications for the suppression of dark current for infrared photodetectors. (C) 2015 AIP Publishing LLC.
引用
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页数:5
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