Measuring Stress Distributions in Ti-6Al-4V Using Synchrotron X-Ray Diffraction

This article presents a quantitative strain analysis (QSA) study aimed at determining the distribution of stress states within a loaded Ti-6Al-4V specimen. Synchrotron X-rays were used to test a sample that was loaded to a uniaxial stress of 540 MPa in situ in the A2 experimental station at the Cornell High Energy Synchrotron Source (CHESS). Lattice-strain pole figures (SPFs) were measured and used to construct a lattice strain distribution function (LSDF) over the fundamental region of orientation space for each phase. A high-fidelity geometric model of the experiment was used to drastically improve the signal-to-noise ratio in the data. The three-dimensional stress states at every possible orientation of each alpha (hcp) and beta (bcc) crystal within the aggregate were calculated using the LSDF and the single-crystal moduli. The stress components varied by 300 to 500 MPa over the orientation space; it was also found that, in general, the crystal stress states were not uniaxial. The maximum shear stress resolved on the basal and prismatic slip systems of all orientations within the alpha phase, which are potential microcrack initiation sites during dwell fatigue conditions, are considered hard and were subsequently illustrated on an electron backscatter diffraction (EBSD) map.