Minimization of Maximum Electric Field in High-Voltage Parallel-Plate Capacitor

被引：0

作者：

Blecic, Raul ^{[1
,2
]}

Diduck, Quentin ^{[3
]}

Baric, Adrijan ^{[1
]}

机构：

[1] Univ Zagreb, Fac Elect Engn & Comp, Unska 3, Zagreb 10000, Croatia

[2] Katholieke Univ Leuven, ESAT TELEMIC, Kasteelpk Arenberg 10, B-3001 Leuven, Belgium

[3] Ballist Devices Inc, 904 Madison St, Santa Clara, CA 95050 USA

来源：

2016 39TH INTERNATIONAL CONVENTION ON INFORMATION AND COMMUNICATION TECHNOLOGY, ELECTRONICS AND MICROELECTRONICS (MIPRO) | 2016年

关键词：

cubic zirconia; dielectric strength; edge effects; electrostatics; fringing fields;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Minimization of maximum electric field of a parallel-plate capacitor for high-voltage and temperature stable applications is presented. Cubic zirconia is used as a dielectric material because of its high relative permittivity, high dielectric strength and high temperature stability. The maximum electric field present in the structure limits the maximum achievable capacitance of the capacitor structure. Reducing the maximum electric field of the capacitor allows to reduce the thickness of the dielectric material, which increases its capacitance. The impact of geometrical and electrical parameters of the parallel-plate capacitor on the maximum electric field is analyzed by a 2D multiphysics solver. The guidelines for the minimization of the maximum electric field are given.

引用

页码：99 / 103

页数：5

共 7 条

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