Quantitative phase imaging by wide field lensless digital holographic microscope

被引:1
作者
Adinda-Ougba, A. [1 ]
Koukourakis, N. [2 ]
Essaidi, A. [3 ]
Gerhardt, N. C. [1 ]
Hofmann, M. R. [1 ]
机构
[1] Ruhr Univ Bochum, Photon & Terahertz Technol, D-44801 Bochum, Germany
[2] Tech Univ Dresden, Lab Measurement & Testing Tech, D-01062 Dresden, Germany
[3] Ruhr Univ Bochum, Laser Applicat Technol, D-44801 Bochum, Germany
来源
OPTICAL METHODS FOR INSPECTION, CHARACTERIZATION, AND IMAGING OF BIOMATERIALS II | 2015年 / 9529卷
关键词
lensless microscopy; digital holography; phase imaging; fault detection; profile measurement; IN-LINE HOLOGRAPHY;
D O I
10.1117/12.2184471
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Wide field, lensless microscopes have been developed for telemedicine and for resource limited setting [1]. They are based on in-line digital holography which is capable to provide amplitude and phase information resulting from numerical reconstruction. The phase information enables achieving axial resolution in the nanometer range. Hence, such microscopes provide a powerful tool to determine three-dimensional topologies of microstructures. In this contribution, a compact, low-cost, wide field, lensless microscope is presented, which is capable of providing topological profiles of microstructures in transparent material. Our setup consist only of two main components: a CMOS-sensor chip and a laser diode without any need of a pinhole. We use this very simple setup to record holograms of micro-objects. A wide field of view of similar to 24 mm(2), and a lateral resolution of similar to 2 mu m are achieved. Moreover, amplitude and phase information are obtained from the numerical reconstruction of the holograms using a phase retrieval algorithm together with the angular spectrum propagation method. Topographic information of highly transparent micro-objects is obtained from the phase data. We evaluate our system by recording holograms of lines with different depths written by a focused laser beam. A reliable characterization of laser written microstructures is crucial for their functionality. Our results show that this system is valuable for determination of topological profiles of microstructures in transparent material.
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页数:8
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