Structural and vibrational properties of PVT grown Bi2Te3 microcrystals

被引：44

作者：

Atuchin, V. V. ^{[1
]}

Gavrilova, T. A. ^{[2
]}

Kokh, K. A. ^{[3
]}

Kuratieva, N. V. ^{[4
]}

Pervukhina, N. V. ^{[4
]}

Surovtsev, N. V. ^{[5
]}

机构：

[1] SB RAS, Lab Opt Mat & Struct, Inst Semicond Phys, Novosibirsk 630090 90, Russia

[2] SB RAS, Lab Nanodiagnost & Nanolithog, Inst Semicond Phys, Novosibirsk 630090, Russia

[3] SB RAS, Lab Crystal Growth, Inst Geol & Mineral, Novosibirsk 630090, Russia

[4] SB RAS, Lab Crystal Chem, Inst Inorgan Chem, Novosibirsk 630090, Russia

[5] SB RAS, Lab Condensed Matter Spect, Inst Automat & Electrometry, Novosibirsk 630090 90, Russia

来源：

SOLID STATE COMMUNICATIONS | 2012年 / 152卷 / 13期

关键词：

Topological insulator; PVT crystal growth; Crystal structure; Raman spectroscopy; TOPOLOGICAL INSULATOR; THERMOELECTRIC PROPERTIES; ULTRATHIN FILMS; BISMUTH; OPTIMIZATION; TRANSPORT; SURFACE;

D O I：

10.1016/j.ssc.2012.04.007

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

High-quality Bi2Te3 microcrystals have been grown by physical vapor transport (PVT) method without using a foreign transport agent. The microcrystals grown under optimal temperature gradient are well facetted and they have dimensions up to similar to 100 mu m. The phase composition of grown crystals has been identified by X-ray single crystal structure analysis in space group R (3) over barm, a=4.3896(2) angstrom, b=30.5019(10) angstrom, Z=3 (R=0.0271). Raman microspectrometry has been used to describe the vibration parameters of Bi2Te3 microcrystals. The FWHM parameters obtained for representative Raman lines at 61 cm(-1) and 101 cm(-1) are as low as 3.5 cm(-1) and 4.5 cm(-1), respectively. (C) 2012 Elsevier Ltd. All rights reserved.

引用

页码：1119 / 1122

页数：4

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