Reliability of 1300-nm spot-size converted lasers for low-cost optical module used in fiber-to-the-home

被引：0

作者：

Oohashi, H

Fukuda, M

Kondo, Y

Wada, M

Sakai, Y

Tohmori, Y

机构：

来源：

22ND EUROPEAN CONFERENCE ON OPTICAL COMMUNICATIONS, PROCEEDINGS, VOLS 1-6: CO-LOCATED WITH: 2ND EUROPEAN EXHIBITION ON OPTICAL COMMUNICATION - EEOC '96 | 1996年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We first report the degradation mode of a spot-size converted (SSC) laser. We succeed in suppressing a buried heterointerface degradation with a combination of MOVPE growth and dry etching techniques (2-inch wafer process). The far-field patterns and wide-temperature operation required for low-cost system application scarcely change during degradation, and the device life is beyond 10(5) hours at 60 degrees C, 10 mW.

引用

页码：B115 / B118

页数：4