Light depolarization induced by sharp metallic tips and effects on Tip-Enhanced Raman Spectroscopy

被引：13

作者：

Gucciardi, P. G. ^{[1
]}

Bonaccorso, F. ^{[1
,2
]}

Lopes, M. ^{[3
]}

Billot, L. ^{[3
]}

de la Chapelle, M. Lamy ^{[3
]}

机构：

[1] CNR, Ist Proc Chim Fis, Sez Messina, I-98158 Messina, Italy

[2] Univ Messina, Dipartimento Fis Mat & Tecnol Fis Avanzate, I-98166 Messina, Italy

[3] Univ Technol Troyes, Lab Nanotechnol & Instrumentat Opt, Inst Charles Delaunay,CNRS, FRE 2848, F-10010 Troyes, France

来源：

THIN SOLID FILMS | 2008年 / 516卷 / 22期

关键词：

Scanning probe tips; Raman spectroscopy; Field enhancement; Scanning Near-Field Optical Microscopy;

D O I：

10.1016/j.tsf.2008.04.042

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Tip-Enhanced Raman Spectroscopy is based on the field enhancement and confinement provided by sharp metallic lips, used to locally excite the Raman emission from molecules, crystals and nanostructures. This technique has recently demonstrated capabilities for nanometer scale optical resolution in Raman analysis and has enormous potential applications in nano- and bio-technologies. In this paper we describe the state-of-the-art experimental techniques, focusing the attention oil the strategies to reduce the far-field background, on new processes to fabricate sharp metallic tips and on the effect of the depolarization produced by metallic tips on Tip-Enhanced Raman spectra of bulk crystals. (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：8064 / 8072

页数：9

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