Fabrication and characterization of Au/n-CdTe Schottky barrier under illumination and dark

被引:2
作者
Bera, Swades Ranjan [1 ]
Saha, Satyajit [1 ]
机构
[1] Vidyasagar Univ, Dept Phys & Technophys, Midnapore 721102, W Bengal, India
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2018年 / 124卷 / 04期
关键词
CURRENT-VOLTAGE CHARACTERISTICS; SOLAR-CELL APPLICATIONS; TEMPERATURE-DEPENDENCE; V CHARACTERISTICS; NANOWIRES; DIODES; PARAMETERS; CDS; HETEROJUNCTION; NANOCRYSTALS;
D O I
10.1007/s00339-018-1697-z
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
CdTe nanoparticles have been grown by chemical reduction method using EDA as capping agent. These are used to fabricate Schottky barrier in a simple cost-effective way at room temperature. The grown nanoparticles are structurally characterized by X-ray diffraction (XRD), Transmission electron microscopy (TEM). The optical properties of nano CdTe is characterized by UV-Vis absorption spectra, PL spectra. The band gap of the CdTe nanoparticles is increased as compared to CdTe bulk form indicating there is blue shift. The increase of band gap is due to quantum confinement. Photoluminescence spectra shows peak which corresponds to emission from surface state. CdTe nanofilm is grown on ITO coated glass substrate by dipping it on toluene containing dispersed CdTe nanoparticles. Schottky barrier of Au/n-CdTe is fabricated on ITO coated glass by vacuum deposition of gold. I-V and C-V characteristics of Au/n-CdTe Schottky barrier junction have been studied under dark and light condition. It is found that these characteristics are influenced by surface or interface traps. The values of barrier height, ideality factor, donor concentration and series resistance are obtained from the reverse bias capacitance-voltage measurements.
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页数:7
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