Surface morphology and step instability on the (000(1)over-bar)C facet of physical vapor transport-grown 4H-SiC single crystal boules

被引:20
作者
Yamaguchi, Tomoki [1 ]
Ohtomo, Kohei [1 ]
Sato, Shunsuke [1 ]
Ohtani, Noboru [1 ,2 ]
Katsuno, Masakazu [3 ]
Fujimoto, Tatsuo [3 ]
Sato, Shinya [3 ]
Tsuge, Hiroshi [3 ]
Yano, Takayuki [3 ]
机构
[1] Kwansei Gakuin Univ, Sch Sci & Technol, Sanda, Hyogo 6691337, Japan
[2] Kwansei Gakuin Univ, R&D Ctr SiC Mat & Proc, Sanda, Hyogo 6691337, Japan
[3] Nippon Steel & Sumitomo Met Corp, Adv Technol Res Labs, Futtsu, Chiba 2938511, Japan
关键词
Surface structure; Atomic force microscopy; Growth from vapor; Semiconducting materials; 6H-SIC(0001); 6H;
D O I
10.1016/j.jcrysgro.2015.09.002
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Surface morphologies on the (000 (1) over bar) C facet of 4H-SiC boules grown using the physical vapor transport method were examined in various scales (from millimeter to nanometer) using different types of microscopies such as differential interference contrast (DIC) optical microscopy and atomic force microscopy (AFM). DIC optical microscopic observation revealed that there are three distinct morphological regions at the growth front of the 4H-SiC boules: the facetted region, non facetted region and intermediate region between them. The local inclination of the facet surface from the {0001} basal plane increases toward the edge of the facetted region and then decreases in the intermediate region. AFM observations revealed that characteristic step structures were established in these two regions and that nitrogen doping significantly influenced the stability of the step structures. Based on the results, the formation mechanism of surface morphologies on the (000 (1) over bar) C facet of 4H-SiC boules is discussed. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:24 / 31
页数:8
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