Growth of MgO thin films on M-, A-, C- and R-plane sapphire by laser ablation

被引:45
作者
Stampe, PA [1 ]
Bullock, M [1 ]
Tucker, WP [1 ]
Kennedy, RJ [1 ]
机构
[1] Florida A&M Univ, Dept Phys, Tallahassee, FL 32307 USA
关键词
D O I
10.1088/0022-3727/32/15/304
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epitaxial MgO thin films have been grown on single crystal substrates of M-plane (10 (1) over bar 0), A-plane ((1) over bar (1) over bar 20), C-plane (0001) and R-plane (1 (1) over bar 02) sapphire by laser ablation of a Mg metal target in a molecular oxygen atmosphere using 1064 nm radiation from a Nd:YAG laser. X-ray measurements indicate that the MgO grows epitaxially; on all substrates, with its orientation dependent on the cut of the sapphire substrate. (110)-oriented MgO grows on M-plane sapphire, while (111)-oriented MgO films are found on both the A-plane and the C-plane sapphire. The orientation of MgO found on R-plane sapphire appears to be surface and temperature dependent. The principal growth orientation obtained on the R-plane is (100)-oriented MgO although (100) growth tilted 30 degrees from the [1 (1) over bar 1] Al2O3 direction can result. X-ray area mapping has been performed to determine the mosaicity, d value spread and strain present in the films. These data are compared with the in-plane orientation and the mismatch of the MgO and Al2O3 lattices in an attempt to relate the preferred orientation to the plane of the sapphire on which it is grown.
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页码:1778 / 1787
页数:10
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