Automotive Microcontroller End-of-Line Test via Software-based Methodologies

被引：2

作者：

Di Palma, W. ^{[1
]}

Ravotto, D. ^{[2
]}

Sanchez, E. ^{[2
]}

Schillaci, M. ^{[2
]}

Reorda, M. Sonza ^{[2
]}

Squillero, G. ^{[2
]}

机构：

[1] Magneti Marelli, Turin, Italy

[2] Politetecnico Torin, Turin, Italy

来源：

MTV 2007: EIGHTH INTERNATIONAL WORKSHOP ON MICROPROCESSOR TEST AND VERIFICATION, PROCEEDINGS | 2008年

关键词：

D O I：

10.1109/MTV.2007.15

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

The car market shows a clear trend towards an increasing presence of electronic devices in engine control systems, due to a strong market drive towards high-performance control systems. Empirical evidence shows that a conventional screening approach only targeting system functionality is not enough to reach the desired high-quality targets. In this paper a methodology is presented to generate a set of test programs that are able to perform a stress test on a widely known microcontroller core. The obtained test set is then characterized in terms of functional coverage.

引用

页码：77 / +

页数：2

共 8 条

[1] Instruction randomization self test for processor cores
Batcher, K
Papachristou, C
[J]. 17TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1999, : 34 - 40
[2] CHEN L, 2000, IEEE VLSI TEST S, P255
[3] *FREESC SEM INC, E200Z6 REF MAN
[4] *FREESC SEM INC, MPC5554 MPC5553 REF
[5] FRITS - A microprocessor functional BIST method
Parvathala, P
Maneparambil, K
Lindsay, W
[J]. INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS, 2002, : 590 - 598
[6] Deterministic software-based self-testing of embedded processor cores
Paschalis, A
Gizopoulos, D
Kranitis, N
Psarakis, M
Zorian, Y
[J]. DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS, 2001, : 92 - 96
[7] THATTE SM, 1980, IEEE T COMPUT, V29, P429, DOI 10.1109/TC.1980.1675602
[8] Testability analysis and scalable test generation for high-speed floating-point units
Xenoulis, George
Psarakis, Mihalis
Gizopoulos, Dimitris
Paschalis, Antonis
[J]. IEEE TRANSACTIONS ON COMPUTERS, 2006, 55 (11) : 1449 - U24

← 1 →