A Connection Between Pattern Classification by Machine Learning and Statistical Inference With the General Linear Model

被引:12
作者
Gorriz, J. M. [1 ,2 ]
Jimenez-Mesa, C. [1 ]
Segovia, F. [1 ]
Ramirez, J. [1 ]
Suckling, J. [2 ]
机构
[1] Univ Granada, Data Sci & Computat Intelligence Inst, Granada 18071, Spain
[2] Univ Cambridge, Dept Psychiat, Herchel Smith Buidling Brain & Mind Sci, Forvie Site Robinson Way, Cambridge CB2 0SZ, England
关键词
Maximum likelihood estimation; Mathematical model; Probability; Linear regression; Bioinformatics; Neuroimaging; Predictive models; General linear model; Linear Regression Model; pattern classification; upper bounds; permutation tests; cross-validation; SUPPORT VECTOR MACHINES; PERMUTATION TESTS; DIAGNOSIS; FRAMEWORK; DISEASE;
D O I
10.1109/JBHI.2021.3101662
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
A connection between the general linear model (GLM) with frequentist statistical testing and machine learning (MLE) inference is derived and illustrated. Initially, the estimation of GLM parameters is expressed as a Linear Regression Model (LRM) of an indicator matrix; that is, in terms of the inverse problem of regressing the observations. Both approaches, i.e. GLM and LRM, apply to different domains, the observation and the label domains, and are linked by a normalization value in the least-squares solution. Subsequently, we derive a more refined predictive statistical test: the linear Support Vector Machine (SVM), that maximizes the class margin of separation within a permutation analysis. This MLE-based inference employs a residual score and associated upper bound to compute a better estimation of the actual (real) error. Experimental results demonstrate how parameter estimations derived from each model result in different classification performance in the equivalent inverse problem. Moreover, using real data, the MLE-based inference including model-free estimators demonstrates an efficient trade-off between type I errors and statistical power.
引用
收藏
页码:5332 / 5343
页数:12
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