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- [6] High-resolution examination of recording marks in phase-change media using a scanning near-field optical microscope JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (6A): : 3599 - 3602
- [7] High-resolution examination of recording marks in phase-change media using a scanning near-field optical microscope Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2000, 39 (6 A): : 3599 - 3602