EM methods for full-wave characterization of microwave integrated circuits

被引：0

作者：

Yagoub, Mustapha C. E. ^{[1
]}

Tounsi, Mohamed L. ^{[2
]}

Vuong, Tan-Phu ^{[3
]}

机构：

[1] Univ Ottawa, SITE, 800 King Edward, Ottawa, ON K1N 6N5, Canada

[2] USTHB, Fac Elect & Informat, Algiers 16111, Algeria

[3] ESISAR, INPG, F-26902 Valence, France

来源：

2007 CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING, VOLS 1-3 | 2007年

关键词：

component; electromagnetics; microwave circuits; passive structures; numerical methods;

D O I：

暂无

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

Higher integration and smaller layout size, two major trends in today's radio frequency and microwave industry, lead to more prominent electromagnetic high order effects. In this paper, the authors present a survey of existing electromagnetic techniques used to compute such effects in microwave integrated circuits, highlighting their specific advantages/disadvantages for a circuit designer.

引用

页码：1675 / 1678

页数：4