EM methods for full-wave characterization of microwave integrated circuits

被引：0
作者：
Yagoub, Mustapha C. E. [1 ]
Tounsi, Mohamed L. [2 ]
Vuong, Tan-Phu [3 ]
机构：
[1] Univ Ottawa, SITE, 800 King Edward, Ottawa, ON K1N 6N5, Canada
[2] USTHB, Fac Elect & Informat, Algiers 16111, Algeria
[3] ESISAR, INPG, F-26902 Valence, France
来源：
2007 CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING, VOLS 1-3 | 2007年
关键词：
component; electromagnetics; microwave circuits; passive structures; numerical methods;
D O I：
暂无
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
Higher integration and smaller layout size, two major trends in today's radio frequency and microwave industry, lead to more prominent electromagnetic high order effects. In this paper, the authors present a survey of existing electromagnetic techniques used to compute such effects in microwave integrated circuits, highlighting their specific advantages/disadvantages for a circuit designer.
引用
收藏
页码：1675 / 1678
页数：4
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