A Novel Algorithm for Wall Characterization in Through the wall Imaging based on Spectral Analysis

被引：0

作者：

Sadeghi, S. ^{[1
]}

Mohammadpour-Aghdam, K. ^{[1
]}

Faraji-Dana, R. ^{[1
]}

Burkholder, Robert J. ^{[2
]}

机构：

[1] Univ Tehran, Sch Elect & Comp Engn, Tehran, Iran

[2] Ohio State Univ, Dept Elect & Comp Engn, ElectroSci Lab, Columbus, OH 43210 USA

来源：

2018 18TH INTERNATIONAL SYMPOSIUM ON ANTENNA TECHNOLOGY AND APPLIED ELECTROMAGNETICS (ANTEM 2018) | 2018年

关键词：

Spectral analysis; Generalized pencil of function (GMT); through the wall imaging; wall characterization;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Estimation of wall parameters is a critical key for proper through the wall imaging. In this paper, a novel algorithm based on spectral analysis and wall reflection coefficients is presented and shown to be able to accurately estimate the essential parameters of the homogeneous wall. This method just requires S parameter measurement and proposed formulation makes it useful for any realistic imaging problem. The formulation of the proposed algorithm is discussed along with its application to simulated and measured results

引用

页数：2