AlGaN/GaN HEMT's photoresponse to high intensity THz radiation

被引:7
作者
Dyakonova, N. [1 ]
But, D. B. [1 ]
Coquillat, D. [1 ]
Knap, W. [1 ]
Drexler, C. [2 ]
Olbrich, P. [2 ]
Karch, J. [2 ]
Schafberger, M. [2 ]
Ganichev, S. D. [2 ]
Ducournau, G. [3 ]
Gaquiere, C. [3 ]
Poisson, M. -A. [4 ]
Delage, S. [4 ]
Cywinski, G. [5 ]
Skierbiszewski, C. [5 ]
机构
[1] Univ Montpellier 2, CNRS, L2C, UMR 5221, F-34095 Montpellier, France
[2] Univ Regensburg, Terahertz Ctr, D-93053 Regensburg, Germany
[3] CNRS, Inst Elect & Microelect Nord, UMR 8520, F-59652 Villeneuve Dascq, France
[4] Thales Thales Res & Technol, F-91404 Orsay, France
[5] Unipress, PAS, Inst High Pressure Phys, PL-01142 Warsaw, Poland
关键词
terahertz; photoresponse; HEMT; ALGaN/GaN; TERAHERTZ RADIATION;
D O I
10.1515/oere-2015-0026
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on the photoresponse dependence on the terahertz radiation intensity in ALGaN/GaN HEMTs. We show that the ALGaN/GaN HEMT can be used as a THz detector in CW and in pulsed regime up to radiation intensity of several kW/cm(2). The dynamic range in the pulsed regime of detection can be more than 2 decades. We observed that the photoresponse of the HEMT could have a compound composition if two independent parts of the transistor are involved in the detection process; this result indicates that a more simple one channel device may be preferable on the detection purpose.
引用
收藏
页码:195 / 199
页数:5
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