Correlation of the structural properties of a Pt seed layer with the perpendicular magnetic anisotropy features of full Heusler-based Co2FeAl/MgO/Co2Fe6B2 junctions via a 12-inch scale Si wafer process

被引:10
作者
Chae, Kyo-Suk [1 ,2 ]
Lee, Du-Yeong [1 ]
Shim, Tae-Hun [1 ]
Hong, Jin-Pyo [3 ]
Park, Jea-Gun [1 ]
机构
[1] Hanyang Univ, Dept Elect, MRAM Ctr, Seoul 133791, South Korea
[2] Samsung Elect Co Ltd, Hwasung City 445701, Gyeonggi Do, South Korea
[3] Hanyang Univ, Dept Phys, Seoul 133791, South Korea
关键词
D O I
10.1063/1.4824306
中图分类号
O59 [应用物理学];
学科分类号
摘要
We elucidated the interfacial-perpendicular magnetic anisotropy (i-PMA) features of full Heusler-based Co2FeAl/MgO/Co2Fe6B2 magnetic-tunnel-junctions as functions of the structural properties of the Pt seed layer including its thickness and ex situ annealing temperature. All of the samples were prepared in a 12-inch silicon wafer process for real industry applications. The observations of the M-H loops emphasize that a thinner Pt seed layer and a high ex situ annealing temperature enhance the surface roughness of the seed layer, providing better i-PMA characteristics. HR-TEM images of the samples were evaluated to understand the structural effects of thin and thick Pt seed layers. (C) 2013 AIP Publishing LLC.
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页数:4
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