Shape-dependent optical properties of self-assembled InAs/GaAs quantum dots

被引:1
|
作者
Kim, JS [1 ]
Lee, CR
Lee, JI
Leem, JY
机构
[1] ETRI, Basic Res Labs, Taejon, South Korea
[2] Chonbuk Natl Univ, Sch Adv Mat Engn, Chonju, South Korea
[3] Korea Res Inst Stand & Sci, Mat Evaluat Ctr, Taejon, South Korea
[4] Inje Univ, Sch Nano Engn, Gimhae, South Korea
关键词
internal electric field; self-assembled quantum dot; solid source molecular beam epitaxy;
D O I
10.1016/j.jcrysgro.2005.11.094
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Self-assembled InAs quantum dots (QDs) covered by an In0.15Ga0.85As layer with two different thicknesses were, respectively, grown on GaAs(001) substrates by a solid-source molecular beam epitaxy, and were investigated by cross-sectional transmission electron microscopy (XTEM) and photoluminescence spectroscopy under the various bias conditions. From the XTEM images the shape, especially height, of InAs QDs can be significantly modified by changing the thickness of an In0.15Ga0.85As overgrowth layer, resulting in the modification of the optical properties. With an increase in the QD height leading to more isotropic shape of QDs, the relatively better optical properties such as larger energy-level spacing between the ground states and the first excited states, and enhanced stability to the external bias conditions were demonstrated. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:68 / 71
页数:4
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