Stein's method and a quantitative Lindeberg CLT for the Fourier transforms of random vectors

被引:4
作者
Berckmoes, B.
Lowen, R.
Van Casteren, J.
机构
关键词
CLT; Fourier transform; Lindeberg's condition; Stein's method; Approach theory; Limit operator; MULTIVARIATE NORMAL APPROXIMATION; EXCHANGEABLE PAIRS; THEOREM; CONVERGENCE; DEPENDENCE; DISTANCES;
D O I
10.1016/j.jmaa.2015.08.040
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
We use a multivariate version of Stein's method to establish a quantitative Lindeberg CLT for the Fourier transforms of random N-vectors. We achieve this, conceptually mainly by constructing a natural approach structure on N-random vectors overlying the topology of weak convergence, and technically mainly by deducing a specific integral representation for the Hessian matrix of a solution to the Stein equation with test function e(t)(x) = exp (-i Sigma(N)(k=1) t(k)x(k)), where t, x is an element of R-N. (C) 2015 Elsevier Inc. All rights reserved.
引用
收藏
页码:1441 / 1458
页数:18
相关论文
共 26 条
[1]   EXISTENCE OF TSCHEBYSCHEV CENTERS, BEST N-NETS AND BEST COMPACT APPROXIMANTS [J].
AMIR, D ;
MACH, J ;
SAATKAMP, K .
TRANSACTIONS OF THE AMERICAN MATHEMATICAL SOCIETY, 1982, 271 (02) :513-524
[2]  
[Anonymous], 2009, Inst. Math. Stat. (IMS) Collect.
[3]  
[Anonymous], AUSTR J STAT
[4]  
[Anonymous], 1975, THESIS U SINGAPORE
[5]   STEIN METHOD FOR DIFFUSION APPROXIMATIONS [J].
BARBOUR, AD .
PROBABILITY THEORY AND RELATED FIELDS, 1990, 84 (03) :297-322
[6]   On the dependence of the Berry-Esseen bound on dimension [J].
Bentkus, V .
JOURNAL OF STATISTICAL PLANNING AND INFERENCE, 2003, 113 (02) :385-402
[7]   An isometric study of the Lindeberg-Feller central limit theorem via Stein's method [J].
Berckmoes, B. ;
Lowen, R. ;
Van Casteren, J. .
JOURNAL OF MATHEMATICAL ANALYSIS AND APPLICATIONS, 2013, 405 (02) :484-498
[8]   Approach theory meets probability theory [J].
Berckmoes, B. ;
Lowen, R. ;
Van Casteren, J. .
TOPOLOGY AND ITS APPLICATIONS, 2011, 158 (07) :836-852
[9]   Distances on probability measures and random variables [J].
Berckmoes, B. ;
Lowen, R. ;
Van Casteren, J. .
JOURNAL OF MATHEMATICAL ANALYSIS AND APPLICATIONS, 2011, 374 (02) :412-428
[10]  
Bhattacharya R.N., 2010, TECHNICAL REPORT