Analysis of scanning probe microscope images using wavelets

被引：19

作者：

Gackenheimer, C ^{[1
]}

Cayon, L ^{[1
]}

Relfenberger, R ^{[1
]}

机构：

[1] Purdue Univ, Dept Phys, W Lafayette, IN 47907 USA

来源：

ULTRAMICROSCOPY | 2006年 / 106卷 / 4-5期

关键词：

scanning probe microscopy;

D O I：

10.1016/j.ultramic.2005.11.006

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The utility of wavelet transforms for analysis of scanning probe images is investigated. Simulated scanning probe images are analyzed using wavelet transforms and compared to a parallel analysis using more conventional Fourier transform techniques. The wavelet method introduced in this paper is particularly useful as an image recognition algorithm to enhance nanoscale objects of a specific scale that may be present in scanning probe images. In its present form, the applied wavelet is optimal for detecting objects with rotational symmetry. The wavelet scheme is applied to the analysis of scanning probe data to better illustrate the advantages that this new analysis tool offers. The wavelet algorithm developed for analysis of scanning probe microscope (SPM) images has been incorporated into the WSxM software which is a versatile freeware SPM analysis package. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：389 / 397

页数：9

共 16 条

[1]

BERNARD VE, 2004, MNRAS, V352, P961

[2] ATOMIC FORCE MICROSCOPE [J].