PyNX.Ptycho: a computing library for X-ray coherent diffraction imaging of nanostructures

被引:38
|
作者
Mandula, Ondrej [1 ,2 ,3 ,4 ]
Aizarna, Marta Elzo [2 ,3 ,4 ]
Eymery, Joel [3 ,4 ]
Burghammer, Manfred [2 ]
Favre-Nicolin, Vincent [2 ,3 ,4 ,5 ]
机构
[1] Fdn Nanosci, Grenoble, France
[2] ESRF, F-38043 Grenoble 9, France
[3] Univ Grenoble Alpes, INAC, SP2M, F-38000 Grenoble, France
[4] CEA, INAC, SP2M, F-38000 Grenoble, France
[5] Inst Univ France, Paris, France
来源
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2016年 / 49卷
关键词
PyNX.Ptycho; ptychography; X-ray coherent diffraction imaging; nanostructures; PHASE-RETRIEVAL; STRAIN; MICROSCOPY; FIELDS; BEAM;
D O I
10.1107/S1600576716012279
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
X-ray imaging techniques have undergone a remarkable development during the past decade, taking advantage of coherent X-ray sources. Among these techniques, ptychography allows reconstruction of the specimen and the illumination probe from a series of diffraction patterns without any prior knowledge about the sample. However, the reconstruction of the ptychographic data remains challenging and the reconstruction software is often not publicly available. Presented here is an open-source library for the reconstruction of two-dimensional ptychographic data, written in Python. This library implements existing algorithms, with examples of data reconstruction on both simulated and experimental (Bragg ptychography on heterogeneous strained InAs/GaAs nanowires) data sets. It can be used for educational (simulation) purposes or experimental data analysis, and also features an OpenCL version of the ptychography algorithm for high-performance computing.
引用
收藏
页码:1842 / 1848
页数:7
相关论文
共 50 条
  • [21] Coherent X-ray Imaging
    Salditt, Tim
    Robisch, Anna-Lena
    NANOSCALE PHOTONIC IMAGING, 2020, 134 : 35 - 70
  • [22] Coherent X-ray diffraction investigation of twinned microcrystals
    Aranda, Miguel A. G.
    Berenguer, Felisa
    Bean, Richard J.
    Shi, Xiaowen
    Xiong, Gang
    Collins, Stephen P.
    Nave, Colin
    Robinson, Ian K.
    JOURNAL OF SYNCHROTRON RADIATION, 2010, 17 : 751 - 760
  • [23] X-ray nanobeam diffraction imaging of materials
    Schulli, Tobias U.
    Leake, Steven J.
    CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 2018, 22 (05) : 188 - 201
  • [24] Probing Organic Thin Films by Coherent X-ray Imaging and X-ray Scattering
    Patil, Nilesh
    Narayanan, Theyencheri
    Michels, Leander
    Skjonsfjell, Eirik Torbjorn Bakken
    Guizar-Sicairos, Manuel
    Van den Brande, Niko
    Claessens, Raf
    Van Mele, Bruno
    Breiby, Dag Werner
    ACS APPLIED POLYMER MATERIALS, 2019, 1 (07) : 1787 - 1797
  • [25] Compound focusing mirror and X-ray waveguide optics for coherent imaging and nano-diffraction
    Salditt, Tim
    Osterhoff, Markus
    Krenkel, Martin
    Wilke, Robin N.
    Priebe, Marius
    Bartels, Matthias
    Kalbfleisch, Sebastian
    Sprung, Michael
    JOURNAL OF SYNCHROTRON RADIATION, 2015, 22 : 867 - 878
  • [26] Nanoparticle Structure by Coherent X-ray Diffraction
    Robinson, Ian
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 2013, 82 (02)
  • [27] Impact and mitigation of angular uncertainties in Bragg coherent x-ray diffraction imaging
    Calvo-Almazan, I
    Allain, M.
    Maddali, S.
    Chamard, V
    Hruszkewycz, S. O.
    SCIENTIFIC REPORTS, 2019, 9 (1)
  • [28] Studies of Materials at the Nanometer Scale Using Coherent X-Ray Diffraction Imaging
    Sandberg, Richard L.
    Huang, Zhifeng
    Xu, Rui
    Rodriguez, Jose A.
    Miao, Jianwei
    JOM, 2013, 65 (09) : 1208 - 1220
  • [29] Preliminary exploration of hard X-ray coherent diffraction imaging method at SSRF
    Zhou Guang-Zhao
    Hu Zhe
    Yang Shu-Min
    Liao Ke-Liang
    Zhou Ping
    Liu Ke
    Hua Wen-Qiang
    Wang Yu-Zhu
    Bian Feng-Gang
    Wang Jie
    ACTA PHYSICA SINICA, 2020, 69 (03)
  • [30] Coherent X-ray Diffraction Imaging for Strain Analysis on Single ZnO Nanorod
    Xiong, Gang
    Leake, S.
    Newton, M. C.
    Huang, X.
    Harder, R.
    Robinson, Ian K.
    PHYSICS OF SEMICONDUCTORS: 30TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF SEMICONDUCTORS, 2011, 1399