An advanced photogrammetric method to measure surface roughness: Application to volcanic terrains in the Piton de la Fournaise, Reunion Island

被引:57
作者
Bretar, F. [1 ]
Arab-Sedze, M. [2 ,3 ]
Champion, J. [2 ]
Pierrot-Deseilligny, M. [4 ]
Heggy, E. [5 ]
Jacquemoud, S. [2 ]
机构
[1] CETE Normandie Ctr, Lab Ponts & Chaussees, F-76121 Grand Quevilly, France
[2] Univ Paris Diderot, Sorbonne Paris Cite, Inst Phys Globe Paris, UMR CNRS 7154, F-75013 Paris, France
[3] IGN, Lab MATIS, F-94160 St Mande, France
[4] IGN ENSG, Lab Geomat Appl, F-77455 Marne La Vallee 2, France
[5] NASA, Jet Prop Lab, Pasadena, CA 91109 USA
基金
美国国家航空航天局;
关键词
Surface roughness; Image correlation; Volcanic terrains; Roughness anisotropy; Microtopography; FRACTAL DIMENSION; SOIL ROUGHNESS; BACKSCATTERING; RETRIEVAL; FEATURES;
D O I
10.1016/j.rse.2013.03.026
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
We present a rapid in situ photogrammetric method to characterize surface roughness by taking overlapping photographs of a scene. The method uses a single digital camera to create a high-resolution digital terrain model (pixel size of similar to 1.32 mm) by means of a free open-source stereovision software. It is based on an auto-calibration process, which calculates the 3D geometry of the images, and an efficient multi-image correlation algorithm. The method is successfully applied to four different volcanic surfaces namely, a'a lava flows, pahoehoe lava flows, slabby pahoehoe lava flows, and lapilli deposits. These surfaces were sampled in the Piton de la Foumaise volcano (Reunion Island) in October, 2011, and displayed various terrain roughnesses. Our in situ measurements allow deriving digital terrain models that reproduce the millimeter-scale height variations of the surfaces over about 12 m(2). Five parameters characterizing surface topography are derived along unidirectional profiles: the root-mean-square height (xi), the correlation length (L-c), the ratio Z(s) = xi(2)/L-c, the tortuosity index (t), and the fractal dimension (D). Anisotropy in the surface roughness has been first investigated using 1-m-long profiles circularly arranged around a central point. The results show that L-c, Z(s) and D effectively catch preferential directions in the structure of bare surfaces. Secondly, we studied the variation of these parameters as a function of the profile length by drawing random profiles from 1 to 12 m in length. We verified that xi and L-c increase with the profile length and, therefore, are not appropriate to characterize surface roughness variation. We conclude that Z(s) and D are better suited to extract roughness information for multiple eruptive terrains with complex surface texture. (C) 2013 Elsevier Inc. All rights reserved.
引用
收藏
页码:1 / 11
页数:11
相关论文
共 39 条
[1]   Off-the-shelf laser scanning and close-range digital photogrammetry for measuring agricultural soils microrelief [J].
Aguilar, M. A. ;
Aguilar, F. J. ;
Negreiros, J. .
BIOSYSTEMS ENGINEERING, 2009, 103 (04) :504-517
[2]   Relationship between profile length and roughness variables for natural surfaces [J].
Baghdadi, N ;
Paillou, P ;
Grandjean, G ;
Dubois, P ;
Davidson, M .
INTERNATIONAL JOURNAL OF REMOTE SENSING, 2000, 21 (17) :3375-3381
[3]   Automatic detection of anisotropic features on rock surfaces [J].
Baker, Bodey R. ;
Gessner, Klaus ;
Holden, Eun-Jung ;
Squelch, Andrew P. .
GEOSPHERE, 2008, 4 (02) :418-428
[4]  
Beckmann P., 1987, Scattering of Electromagnetic Waves from Rough Surfaces
[5]  
Bennett J., 1999, INTRO SURFACE ROUGHN
[6]   TESTING ROUGHNESS INDEXES TO ESTIMATE SOIL SURFACE-ROUGHNESS CHANGES DUE TO SIMULATED RAINFALL [J].
BERTUZZI, P ;
RAUWS, G ;
COURAULT, D .
SOIL & TILLAGE RESEARCH, 1990, 17 (1-2) :87-99
[7]   AN AUTOMATED, NONCONTACT LASER PROFILE METER FOR MEASURING SOIL ROUGHNESS INSITU [J].
BERTUZZI, P ;
CAUSSIGNAC, JM ;
STENGEL, P ;
MOREL, G ;
LORENDEAU, JY ;
PELLOUX, G .
SOIL SCIENCE, 1990, 149 (03) :169-178
[8]   Characterizing Bidimensional Roughness of Agricultural Soil Surfaces for SAR Modeling [J].
Blaes, Xavier ;
Defourny, Pierre .
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, 2008, 46 (12) :4050-4061
[9]   ALGORITHM FOR COMPUTER CONTROL OF A DIGITAL PLOTTER [J].
BRESENHAM, JE .
IBM SYSTEMS JOURNAL, 1965, 4 (01) :25-30
[10]   Lava flow surface roughness and depolarized radar scattering [J].
Campbell, BA ;
Shepard, MK .
JOURNAL OF GEOPHYSICAL RESEARCH-PLANETS, 1996, 101 (E8) :18941-18951