Chemical Solution Deposition of BiFeO3Films with Layer-by-Layer Control of the Coverage and Composition

被引：5

作者：

Abramov, Alexander ^{[1
]}

Alikin, Denis ^{[1
]}

Sobol, Alexander ^{[2
]}

Myakishev, Dmitry ^{[2
]}

Slabov, Vladislav ^{[3
,4
]}

Trusov, Lev ^{[2
]}

Safina, Violetta ^{[1
]}

Turygin, Anton ^{[1
]}

Vasiliev, Alexander ^{[2
]}

Shur, Vladimir ^{[1
]}

Kholkin, Andrei ^{[1
,3
,4
]}

机构：

[1] Ural Fed Univ, Sch Nat Sci & Math, Ekaterinburg 620000, Russia

[2] Moscow MV Lomonosov State Univ, Fac Chem, Moscow 119991, Russia

[3] Univ Aveiro, Dept Phys, P-3810193 Aveiro, Portugal

[4] Univ Aveiro, CICECO Aveiro Inst Mat, P-3810193 Aveiro, Portugal

来源：

COATINGS | 2020年 / 10卷 / 05期

基金：

俄罗斯科学基金会;

关键词：

sol-gel; bismuth ferrite; gelation; piezoresponse; PFM; C-AFM; BIFEO3; THIN-FILMS; CONDUCTION;

D O I：

10.3390/coatings10050438

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Chemical solution deposition of BiFeO(3)thin films is one of the most commercially available techniques to produce large-scale low-cost coatings for further application in memory devices. In this contribution, we implemented piezoresponse force and conductive atomic force microscopies to study the layer-by-layer sol-gel deposition of BiFeO(3)thin films focusing on the local phase distribution, morphology, piezoelectric response, and leakage current. The final properties of resulting thin films are found to be determined not only by the composition of the gel and crystallization step but by the gelation step as well. The drying temperature and treatment duration of the solution are shown to drastically influence the film coverage, which finally determines the morphology of the films and behavior of the crystallization process.

引用

页数：11

共 36 条

[1] Calibration of the in-plane PFM response by the lateral force curves
Alikin, D. O.
Abramov, A. S.
Kosobokov, M. S.
Gimadeeva, L. V.
Romanyuk, K. N.
Slabov, V.
Shur, V. Ya.
Kholkin, A. L.
[J]. FERROELECTRICS, 2020, 559 (01) : 15 - 21
[2] Quantitative phase separation in multiferroic Bi0.88Sm0.12FeO3 ceramics via piezoresponse force microscopy
Alikin, D. O.
Turygin, A. P.
Walker, J.
Rojac, T.
Shvartsman, V. V.
Shur, V. Ya.
Kholkin, A. L.
[J]. JOURNAL OF APPLIED PHYSICS, 2015, 118 (07)
[3] Correlative Confocal Raman and Scanning Probe Microscopy in the Ionically Active Particles of LiMn2O4 Cathodes
Alikin, Denis
Slautin, Boris
Abramov, Alexander
Rosato, Daniele
Shur, Vladimir
Tselev, Alexander
Kholkin, Andrei
[J]. MATERIALS, 2019, 12 (09)
[4] Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy
Balke, Nina
Jesse, Stephen
Yu, Pu
Carmichael, Ben
Kalinin, Sergei V.
Tselev, Alexander
[J]. NANOTECHNOLOGY, 2016, 27 (42)
[5] Physics and Applications of Bismuth Ferrite
Catalan, Gustau
Scott, James F.
[J]. ADVANCED MATERIALS, 2009, 21 (24) : 2463 - 2485
[6] Synthesis and ferroelectric properties of epitaxial BiFeO3 thin films grown by sputtering
Das, R. R.
Kim, D. M.
Baek, S. H.
Eom, C. B.
Zavaliche, F.
Yang, S. Y.
Ramesh, R.
Chen, Y. B.
Pan, X. Q.
Ke, X.
Rzchowski, M. S.
Streiffer, S. K.
[J]. APPLIED PHYSICS LETTERS, 2006, 88 (24)
[7] Combinatorial discovery of a lead-free morphotropic phase boundary in a thin-film piezoelectric perovskite
Fujino, S.
Murakami, M.
Anbusathaiah, V.
Lim, S. -H.
Nagarajan, V.
Fennie, C. J.
Wuttig, M.
Salamanca-Riba, L.
Takeuchi, I.
[J]. APPLIED PHYSICS LETTERS, 2008, 92 (20)
[8] Consequences of the background in piezoresponse force microscopy on the imaging of ferroelectric domain structures
Jungk, T.
Hoffmann, A.
Soergel, E.
[J]. JOURNAL OF MICROSCOPY-OXFORD, 2007, 227 (01): : 72 - 78
[9] BiFeO3 thin films prepared using metalorganic chemical vapor deposition
Kartavtseva, M. S.
Gorbenko, O. Yu.
Kaul, A. R.
Murzina, T. V.
Savinov, S. A.
Barthelemy, A.
[J]. THIN SOLID FILMS, 2007, 515 (16) : 6416 - 6421
[10] High-temperature catalysts through sol-gel synthesis
Lecloux, AJ
Pirard, JP
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1998, 225 (1-3) : 146 - 152

← 1 2 3 4 →