Reduced dark counts in optimized geometries for superconducting nanowire single photon detectors

被引：38

作者：

Akhlaghi, Mohsen K. ^{[1
]}

Atikian, Haig ^{[2
]}

Eftekharian, Amin ^{[1
,3
]}

Loncar, Marko ^{[2
]}

Majedi, A. Hamed ^{[1
,2
,3
]}

机构：

[1] Univ Waterloo, ECE Dept, Waterloo, ON N2L 3G1, Canada

[2] Harvard Univ, Sch Engn & Appl Sci, Cambridge, MA 02138 USA

[3] Univ Waterloo, Inst Quantum Comp, Waterloo, ON N2L 3G1, Canada

来源：

OPTICS EXPRESS | 2012年 / 20卷 / 21期

基金：

美国国家科学基金会; 加拿大自然科学与工程研究理事会;

关键词：

Avalanche photodiodes - Particle beams - Photons;

D O I：

10.1364/OE.20.023610

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have experimentally compared the critical current, dark count rate and photo-response of 100nm wide superconducting nanowires with different bend designs. Enhanced critical current for nanowires with optimally rounded bends, and thus with no current crowding, are observed. Furthermore, we find that the optimally designed bend significantly reduces the dark counts without compromising the photo-response of the device. The results can lead to major improvements in superconducting nanowire single photon detectors. (C) 2012 Optical Society of America

引用

页码：23610 / 23616

页数：7

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