Model-Based Techniques for Data Reliability in Wireless Sensor Networks

被引:43
作者
Mukhopadhyay, Shoubhik [1 ]
Schurgers, Curt [1 ]
Panigrahi, Debashis [1 ]
Dey, Sujit [1 ]
机构
[1] Univ Calif San Diego, Dept Elect & Comp Engn, La Jolla, CA 92093 USA
关键词
Reliability; data models; wireless sensor networks; error correction; SOFT ERRORS;
D O I
10.1109/TMC.2008.131
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Wireless Sensor Networks are a fast-growing class of systems. They offer many new design challenges, due to stringent requirements like tight energy budgets, low-cost components, limited processing resources, and small footprint devices. Such strict design goals call for technologies like nanometer-scale semiconductor design and low-power wireless communication to be used. But using them would also make the sensor data more vulnerable to errors, within both the sensor nodes' hardware and the wireless communication links. Assuring the reliability of the data is going to be one of the major design challenges of future sensor networks. Traditional methods for reliability cannot always be used, because they introduce overheads at different levels, from hardware complexity to amount of data transmitted. This paper presents a new method that makes use of the properties of sensor data to enable reliable data collection. The approach consists of creating predictive models based on the temporal correlation in the data and using them for real-time error correction. This method handles multiple sources of errors together without imposing additional complexity or resource overhead at the sensor nodes. We demonstrate the ability to correct transient errors arising in sensor node hardware and wireless communication channels through simulation results on real sensor data.
引用
收藏
页码:528 / 543
页数:16
相关论文
共 58 条
[1]   FITTING AUTOREGRESSIVE MODELS FOR PREDICTION [J].
AKAIKE, H .
ANNALS OF THE INSTITUTE OF STATISTICAL MATHEMATICS, 1969, 21 (02) :243-&
[2]  
[Anonymous], 1995, Error control systems for digital communication and storage
[3]  
Bandyopadhyay S, 2003, IEEE INFOCOM SER, P1713
[4]   Technology scaling trends and accelerated testing for soft errors in commercial silicon devices [J].
Baumann, R .
9TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS, 2003, :4-4
[5]   Radiation-induced soft errors in advanced semiconductor technologies [J].
Baumann, RC .
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2005, 5 (03) :305-316
[6]  
BYCHKOVSKIY V., 2003, P INT WORKSH INF PRO
[7]   Cluster-based forwarding for reliable end-to-end delivery in wireless sensor networks [J].
Cao, Qing ;
Abdelzaher, Tarek ;
He, Tian ;
Kravets, Robin .
INFOCOM 2007, VOLS 1-5, 2007, :1928-+
[8]  
Chatfield C, 2004, The Analysis of Time Series: An Introduction
[9]  
CUI S, 2005, P IEEE INT AC SPEECH, V4
[10]  
DRINIC M, 2003, P 1 INT C EMB NETW S, P231