Infrared Reflectivity Spectra of Manganite Thin Films Grown on Different Substrates

被引：2
作者：
Antonakos, A. [1 ]
Liarokapis, E. [1 ]
Filippi, M. [2 ]
Prellier, W. [2 ]
Aydogdu, G. H. [3 ]
Habermeier, H. -U. [3 ]
机构：
[1] Natl Tech Univ Athens, Dept Phys, Athens 15780, Greece
[2] ENSICAEN, Lab CRISMAT, CNRS, UMR 6508, F-14050 Caen, France
[3] Max Planck Inst Solid State Res, D-70569 Stuttgart, Germany
来源：
JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM | 2009年 / 22卷 / 02期
关键词：
Infrared; Manganites; Thin films; MAGNETIC-FIELD; RESISTIVITY; MODES;
D O I：
10.1007/s10948-008-0399-8
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have measured the reflectivity infrared (IR) spectra of R1-x Ca (x) MnO3 (R = La, Pr) manganite thin films grown on different substrates (SrTiO3 (STO), LaAlO3 (LAO) and SrLaGaO4 (SLGO)) manganites over a wide frequency (50-5000 cm(-1)) range. In the Far IR (FIR) region the substrates dominate over the manganite spectrum. However, the previously observed infrared active modes or mode pairs could be identified. In the mid-IR (MIR) region, a characteristic insulating gap at 700 cm(-1) is always present for all thin film studied, which shows substrate and thickness dependence.
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页码：109 / 113
页数：5
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