Interplay of polarization fields and Auger recombination in the efficiency droop of nitride light-emitting diodes

被引:174
|
作者
Kioupakis, Emmanouil [1 ,2 ]
Yan, Qimin [1 ]
Van de Walle, Chris G. [1 ]
机构
[1] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
[2] Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
基金
美国国家科学基金会;
关键词
We thank J. Speck; C; Weisbuch; and A. Alkauskas for useful discussions. E.K. was supported as part of the Center for Energy Efficient Materials; an Energy Frontier Research Center funded by the U.S. DOE; BES under Award No. DE-SC0001009. Q.Y. was supported by the UCSB Solid State Lighting and Energy Center. Computational resources were provided by the Center for Scientific Computing at the CNSI and MRL (an NSF MRSEC; DMR-1121053) (NSF CNS-0960316); and the DOE NERSC Facility (DE-AC02-05CH11231);
D O I
10.1063/1.4769374
中图分类号
O59 [应用物理学];
学科分类号
摘要
We use theoretical modeling to investigate the effect of polarization fields and non-radiative Auger recombination on the efficiency-droop and green-gap problems of polar and nonpolar nitride light-emitting diodes. The dependence of radiative and nonradiative recombination rates on electron-hole wave-function overlap is analyzed. Device designs that minimize the polarization fields lead to higher efficiency, not because the internal quantum efficiency is improved at a given carrier density but because they can be operated at a lower carrier density for a given current density. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4769374]
引用
收藏
页数:4
相关论文
共 50 条
  • [21] Semipolar III-nitride light-emitting diodes with negligible efficiency droop up to ∼1 W
    Oh, Sang Ho
    Yonkee, Benjamin P.
    Cantore, Michael
    Farrell, Robert M.
    Speck, James S.
    Nakamura, Shuji
    DenBaars, Steven P.
    APPLIED PHYSICS EXPRESS, 2016, 9 (10)
  • [22] Defect-related tunneling mechanism of efficiency droop in III-nitride light-emitting diodes
    Bochkareva, N. I.
    Voronenkov, V. V.
    Gorbunov, R. I.
    Zubrilov, A. S.
    Lelikov, Y. S.
    Latyshev, P. E.
    Rebane, Y. T.
    Tsyuk, A. I.
    Shreter, Y. G.
    APPLIED PHYSICS LETTERS, 2010, 96 (13)
  • [23] Analysis of efficiency droop in nitride light-emitting diodes by the reduced effective volume of InGaN active material
    Ryu, Han-Youl
    Shin, Dong-Soo
    Shim, Jong-In
    APPLIED PHYSICS LETTERS, 2012, 100 (13)
  • [24] Recombination efficiency in organic single-layer light-emitting diodes at high fields
    Yang, SY
    Xu, Z
    Wang, ZJ
    Xu, XR
    APPLIED PHYSICS LETTERS, 2001, 79 (16) : 2529 - 2531
  • [25] On the uncertainty of the Auger recombination coefficient extracted from InGaN/GaN light-emitting diode efficiency droop measurements
    Piprek, Joachim
    Roemer, Friedhard
    Witzigmann, Bernd
    APPLIED PHYSICS LETTERS, 2015, 106 (10)
  • [26] On the correlation of the Auger generated hot electron emission and efficiency droop in III-N light-emitting diodes
    Sadi, Toufik
    Kivisaari, Pyry
    Oksanen, Jani
    Tulkki, Jukka
    APPLIED PHYSICS LETTERS, 2014, 105 (09)
  • [27] Effect of Auger Electron-Hole Asymmetry on the Efficiency Droop in InGaN Quantum Well Light-Emitting Diodes
    Tsai, Yi-Chia
    Bayram, Can
    Leburton, Jean-Pierre
    IEEE JOURNAL OF QUANTUM ELECTRONICS, 2022, 58 (01)
  • [28] Origin of efficiency droop in GaN-based light-emitting diodes
    Kim, Min-Ho
    Schubert, Martin F.
    Dai, Qi
    Kim, Jong Kyu
    Schubert, E. Fred
    Piprek, Joachim
    Park, Yongjo
    APPLIED PHYSICS LETTERS, 2007, 91 (18)
  • [29] Rate equation analysis of efficiency droop in InGaN light-emitting diodes
    Ryu, Han-Youl
    Kim, Hyun-Sung
    Shim, Jong-In
    APPLIED PHYSICS LETTERS, 2009, 95 (08)
  • [30] Nitride light-emitting diodes
    Mukai, T
    Nagahama, S
    Iwasa, N
    Senoh, M
    Yamada, T
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2001, 13 (32) : 7089 - 7098