Gaussian-to-Top-Hat Beam Shaping - An Overview of Parameters, Methods and Applications

被引:25
作者
Homburg, O. [1 ]
Mitra, T. [1 ]
机构
[1] LIMO Lissotschenko Mikroopt GmbH, D-44319 Dortmund, Germany
来源
LASER RESONATORS, MICRORESONATORS, AND BEAM CONTROL XIV | 2012年 / 8236卷
关键词
micro-machining; beam shaping; top hat; material processing; Gaussian beam; scanner; Powell lens;
D O I
10.1117/12.907914
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Direct laser patterning of various materials is today widely used in several micro-system production lines like inkjet printing, solar cell technology, flat-panel display production, LEDs, OLEDs, semiconductors and medicine. Typically single-mode solid state lasers and their higher harmonics (e. g. 266, 355, 532 and 1064 nm) are used especially for machining of holes and grooves. The striking advantages of flat top intensity distributions compared to Gaussian beam profiles with respect to the efficiency and quality of these processes were already demonstrated. Here we will give an overview of parameters, methods and applications of Gaussian-to-top-hat beam shaping. The top hat field size can start from about 30 mu m with no upper size limitation in the far field of the optics. Beam shaping for various wavelengths were realized with field geometries of squares, rectangles and circles. With LIMO's compact Gaussian-to-top-hat converter an inhomogeneity better than 5% contrast was reached. Special focus is put on the integration of Gaussian-to-top-hat beam shapers in fast scanning systems employing Galvo mirrors and a specially developed f-Theta lens to avoid destruction of the top hat profile within the scan field. Results with a 50x50 mu m(2) top hat size (inhomogeneity down to <10%) in a scan area of 156x156mm(2) are presented. The minimal distortions of the top hat observed within the scan area make LIMO's compact Gaussian-to-top-hat converter excellently suited for industrial scanning applications, e. g. for the processing of solar panels.
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页数:9
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