Planning step-stress life-test with a target acceleration-factor

被引:48
作者
Yeo, KP [1 ]
Tang, LC [1 ]
机构
[1] Natl Univ Singapore, Dept Stat & Appl Probabil, Singapore 119260, Singapore
关键词
accelerated life test; multiple steps; exponential distribution; optimal design;
D O I
10.1109/24.765928
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A sequential approach is presented to plan a multiple-steps step-stress accelerated life test (SSALT) with type-I censoring so as to achieve a pre-specified acceleration factor. An initial optimal plan for a simple SSALT, where one not only has to determine the optimum hold-time under low stress but also the optimum low stress level, is obtained by solving a constrained non-linear program. A backward recursion scheme generates the subsequent optimal low-stress levels and hold-times for multiple-step SSALT. An illustration using a 3-step SSALT is presented. The relative efficiency of the 2-step and 3-step SSALT is investigated. A numerical example illustrates the method under 2-step and 3-step SSALT.
引用
收藏
页码:61 / 67
页数:7
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