Magnetic force microscope tips coated with FePd, FePt, and CoPt alloy films

被引：10

作者：

Ishihara, Shinji ^{[1
]}

Ohtake, Mitsuru ^{[1
]}

Futamoto, Masaaki ^{[1
]}

机构：

[1] Chuo Univ, Fac Sci & Engn, Bunkyo Ku, Tokyo 1128551, Japan

来源：

THIN SOLID FILMS | 2013年 / 546卷

关键词：

Magnetic force microscope tip; Resolution; Switching field; Ordered alloy; FePd; FePt; CoPt; ELECTRON-BEAM;

D O I：

10.1016/j.tsf.2013.06.052

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Magnetic force microscope (MFM) tips are prepared by coating Si tips of 4 nm radius with FePd, FePt, and CoPt films of 80 nm thickness at room temperature followed by annealing at 600 degrees C. The spatial resolution and the switching field are investigated. The resolution of about 9 nm is realized for all the tips. On the contrary, the switching fields of FePd-, FePt-, and CoPt- coated tips are 117.4, 37.8, and 268.6 kA/m, respectively. The crystal structure and the magnetic properties of coated magnetic thin films prepared on flat Si substrates are measured and the interrelationships with the MFM tip characteristics are briefly investigated. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：205 / 210

页数：6

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