Synthesis and characterisation of cadmium titanium oxide thin films by sol-gel technique

被引:17
|
作者
Phani, AR
Passacantando, M
Santucci, S
机构
[1] Univ Aquila, Dept Phys, I-67100 Laquila, Italy
[2] Univ Aquila, Unita INFM, I-67100 Laquila, Italy
关键词
x-ray diffraction;
D O I
10.1016/S0022-3697(01)00025-7
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Crack free, dense and transparent CdTiO3 thin films have been prepared by sol-gel technique using titanium butoxide and cadmium acetate. The formation of the CdTiO3 phase started from 500degreesC annealing temperature onwards. The complete orthorhombic structure of CdTiO3 was formed on Silicon (100) substrate at an annealing temperature of 600degreesC for 5 h. As the annealing temperature increased from 600 to 700degreesC, we have observed the cadmium silicate phase at the interface of Si and CdTiO3 phase. Structural, morphological and elemental evolution of these CdTiO3 thin films produced by sol-gel synthesis were characterised by grazing incidence X-ray diffraction (GIXRD), tapping mode atomic force microscopy (TMAFM), scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) respectively. (C) 2002 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:383 / 392
页数:10
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