EMI/EMC Measurements and Simulations for Cables and PCBs Enclosed Within Metallic Structures

被引:10
作者
Khan, Zulfiqar A. [1 ]
Bayram, Yakup [2 ]
Volakis, John L.
机构
[1] Johnson Controls Inc, Holland, MI 49423 USA
[2] Ohio State Univ, Electrosci Lab, Columbus, OH 43213 USA
关键词
Electromagnetic compatibility (EMC); electromagnetic interference (EMI); measurements; S-parameters;
D O I
10.1109/TEMC.2008.921030
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a series of measurements to study various electromagnetic compatibility (EMC)/electromagnetic interference (EMI) coupling scenarios, frequently encountered in electronic systems. Specifically, field penetration through apertures and coupling of penetrating wires onto the printed circuit boards (PCBs) enclosed by resonant structures are considered. In contrast to other measurements, we focus on multi-cavity enclosures in the presence of cables and PCBs. The purpose of this experimental study is to provide accurate reference data for possible future validation of various computational tools and to test their accuracy and efficiency on realistic platforms. In particular, we validate a recently proposed hybrid scheme based on S-parameters for concurrent EMI/EMC analysis of large structures with enclosed linear/nonlinear circuit devices in active operating mode.
引用
收藏
页码:441 / 445
页数:6
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