Modeling quantitative phase image formation under tilted illuminations

被引：18
作者：
Bon, Pierre [1 ,2 ]
Wattellier, Benoit [2 ]
Monneret, Serge [1 ]
机构：
[1] Aix Marseille Univ, CNRS UMR7249, Inst Fresnel, F-13013 Marseille, France
[2] PHASICS SA, F-91128 Palaiseau, France
来源：
OPTICS LETTERS | 2012年 / 37卷 / 10期
关键词：
DIFFRACTION TOMOGRAPHY; MICROSCOPY;
D O I：
10.1364/OL.37.001718
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A generalized product-of-convolution model for simulation of quantitative phase microscopy of thick heterogeneous specimen under tilted plane-wave illumination is presented. Actual simulations are checked against a much more time-consuming commercial finite-difference time-domain method. Then modeled data are compared with experimental measurements that were made with a quadriwave lateral shearing interferometer. (C) 2012 Optical Society of America
引用
收藏
页码：1718 / 1720
页数：3
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