Accuracy and precision in model based EELS quantification

被引:49
作者
Bertoni, G. [1 ]
Verbeeck, J. [1 ]
机构
[1] Univ Antwerp, EMAT, B-2020 Antwerp, Belgium
关键词
electron energy loss; EELS; model based quantification; accuracy; precision;
D O I
10.1016/j.ultramic.2008.01.004
中图分类号
TH742 [显微镜];
学科分类号
摘要
We present results on model based quantification of electron energy loss spectra (EELS), focusing on the factors that influence accuracy and precision in determining chemical concentrations. Several sources of systematical errors are investigated. The spectrometer entrance aperture determines the collection angle, and the effects of its position with respect to the transmitted beam are investigated, taking into account the diffraction by the crystal structure. The effect of the orientation of the sample is tested experimentally and theoretically on SrTiO3, and finally, a simulated experiment on c-BN at different thicknesses confirms the superior results of the model based method with respect to the conventional method. A test on a set of experimental reference compounds is presented, showing that remarkably good accuracy can be obtained. Recommendations are given to achieve high accuracy and precision in practice. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:782 / 790
页数:9
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