Design of transmission multilayer polarizer for soft X-ray using a merit function

被引:2
|
作者
Tan, Mo Yan [1 ]
Zhu, Jing Tao [1 ]
Wang, Hong Chang [1 ]
Wang, Zhan Shan [1 ]
Chen, Rui [2 ]
Watanabe, Makoto [2 ,3 ,4 ]
机构
[1] Tongji Univ, Dept Phys, Inst Precis Opt Engn, Shanghai 200092, Peoples R China
[2] Shanghai Dianji Univ, Shanghai 200240, Peoples R China
[3] Saga Univ, China & Venture Business Lab, Saga 8408502, Japan
[4] Shanghai Jiao Tong Univ, Inst Composite Mat, Shanghai 200240, Peoples R China
来源
OPTICS EXPRESS | 2009年 / 17卷 / 04期
基金
中国国家自然科学基金;
关键词
EXTREME-ULTRAVIOLET; SCATTERING; RADIATION;
D O I
10.1364/OE.17.002586
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A new method of designing soft X-ray transmission multilayer polarizer for use at a single wavelength using a merit function has been developed. A merit function of product of p-transmittance throughput and logarithm of transmittance polarization ratio was chosen. Characteristics of Mo/Si multilayer calculated using the merit function at 13.0 nm have been compared with those calculated using the traditional method by the present authors and those reported so far. The merit function has given the most optimal results of throughput of 30.0% and polarization ratio of 202. The polarizers of much higher polarization ratio or much larger p-transmittance can be designed by choosing the number of layers and optimizing the thickness of each layer to maximize the merit function. Using this method, the roughness effect has been studied on Mo/Si and La/B multilayer polarizers at 13.0 nm and 6.7 nm, respectively. It was found that the influence of roughness is crucial in shorter wavelength region. (C) 2009 Optical Society of America
引用
收藏
页码:2586 / 2599
页数:14
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