The electric and magnetic properties of Co and Fe films percept from the coexistence of ferromagnetic and microstrip resonance for a T-type microstrip

被引：3

作者：

Yeh, Yi-Chen ^{[2
]}

Jin, Jun-De ^{[3
]}

Li, Ching-Min ^{[2
]}

Lue, Juh Tzeng ^{[1
]}

机构：

[1] Natl Tsing Hua Univ, Dept Phys, Hsinchu 30042, Taiwan

[2] Natl Tsing Hua Univ, Inst Photon Technol, Hsinchu 30042, Taiwan

[3] Natl Tsing Hua Univ, Dept Elect Engn, Hsinchu 30042, Taiwan

来源：

MEASUREMENT | 2009年 / 42卷 / 02期

关键词：

Microwave microstrip; Structure mode resonance; Ferromagnetic resonance; Magnetic Co and Fe films; PENETRATION DEPTH; STRIP;

D O I：

10.1016/j.measurement.2008.06.012

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Ferromagnetic resonance for magnetic thin films is found to be coexisted with the transmission resonance of a T-type microwave microstrip at certain applied magnetic fields. The frequency dependence of conductivity, the magnetization, and the magnetic anisotropy of magnetic films can be eventually solved from the measured resonance frequency and quality Q factors of the resonance spectra. Equivalent resistances (R), inductances (L), and capacitances (C) corresponding to the displayed transmission S-21 spectra are simulated to comply with proper values. With this equivalent circuit, an accurate determination of the magnetic properties can be closely scrutinized. (C) 2008 Elsevier Ltd. All rights reserved.

引用

页码：290 / 297

页数：8

共 13 条

[1] Temperature dependence of the penetration depth in Sr2RuO4:: Evidence for nodes in the gap function [J].

Bonalde, I ;

Yanoff, BD ;

Salamon, MB ;

Van Harlingen, DJ ;

Chia, EME ;

Mao, ZQ ;

Maeno, Y .

PHYSICAL REVIEW LETTERS, 2000, 85 (22) :4775-4778

[2] Coexistence of ferromagnetic resonance and microstrip resonance for nickel films under magnetic fields [J].

Chang, SW ;

Liu, JH ;

Lue, JT .

MEASUREMENT SCIENCE AND TECHNOLOGY, 2003, 14 (05) :583-588

[3] High attenuation tunable microwave notch filters utilizing ferromagnetic resonance [J].

Cramer, N ;

Lucic, D ;

Camley, RE ;

Celinski, Z .

JOURNAL OF APPLIED PHYSICS, 2000, 87 (09) :6911-6913

[4]

EDWARDS TC, 1983, FDN MICROSTRIP CIRCU

[5] MICROSTRIP DISPERSION MODEL [J].

GETSINGER, WJ .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1973, MT21 (01) :34-39

[6] Magnetic force microscopy studies of domain walls in nickel and cobalt films [J].

Hsieh, CT ;

Liu, JQ ;

Lue, JT .

APPLIED SURFACE SCIENCE, 2005, 252 (05) :1899-1909

[7] ACCURATE MODEL FOR OPEN END EFFECT OF MICROSTRIP LINES [J].

KIRSCHNING, M ;

JANSEN, RH ;

KOSTER, NHL .

ELECTRONICS LETTERS, 1981, 17 (03) :123-124

[8] Resistivity measurements of layered metallic films at various microwave frequencies and temperatures using the micro-strip T-junction method [J].

Liu, JH ;

Lin, YC ;

Lue, JT ;

Wu, CJ .

MEASUREMENT SCIENCE AND TECHNOLOGY, 2002, 13 (07) :1132-1137

[9] Microwave penetration depth measurement for high Tc superconductors by dielectric resonators [J].

Lue, HT ;

Lue, JT ;

Tseng, TY .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2002, 51 (03) :433-439

[10] LOSSES ASSOCIATED WITH SPIN DYNAMICS IN FERROMAGNETIC THIN-FILMS [J].

SPENATO, D ;

FESSANT, A ;

GIERALTOWSKI, J ;

LOAEC, J ;

LEGALL, H .

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1995, 140 :1979-1980

← 1 2 →