One-step wet chemical deposition of NiO from the electrochemical reduction of nitrates in ionic liquid based electrolytes

被引:19
作者
Azaceta, Eneko [1 ]
Ngo Thi Tuyen [1 ]
Pickup, David F. [2 ,3 ]
Rogero, Celia [2 ,4 ]
Enrique Ortega, J. [2 ,3 ,4 ]
Miguel, Oscar [1 ]
Grande, Hans-Jurgen [1 ]
Tena-Zaera, Ramon [1 ]
机构
[1] CIDETEC IK4, Dept Energy, Donostia San Sebastian 20009, Spain
[2] Ctr Phys Mat, San Sebastian 20018, Spain
[3] Univ Basque Country, Dept Fis Aplicada 1, San Sebastian 20018, Spain
[4] Donostia Int Phys Ctr, San Sebastian 20018, Spain
关键词
Nickel oxide; Electrochemical deposition; Ionic liquid; Pyrrolidiunium; p-n junction; NICKEL-OXIDE; THIN-FILMS; ELECTRODEPOSITION; METAL; NANOPARTICLES; SENSITIZATION; PERFORMANCE; TRANSPORT; BEHAVIOR; GROWTH;
D O I
10.1016/j.electacta.2013.02.089
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Aprotic PYR14TESI (1-butyl-1-methylpyrrolidinium bis(trifluoromethanesulfonyl)) ionic liquid served to develop a new electrochemical route for one-step deposition of NiO from PYR14NO(3) reduction (1-butyl-1-methylpyrrolidinium nitrate) in a Ni(TFSI)(2) (Nickel (II) bis(trifluoromethanesulfonyl)imide) containing electrolyte. The high solubility of the novel PYR14NO(3) salt in PYR14TFSI (>0.1 M) in comparison with other oxygenated precursors such as oxygen gas, NaNO3 or KNO3 (i.e. 10-15 mM) allows the formulation of a broad variety of electrolytes which opens wide possibilities to tune the physico-chemical properties of NiO films (e.g. morphology: from flat to nanostructured films). Furthermore, electrochemical deposition in an electrolyte containing low water concentration (>30 ppm by Karl Fisher titration) served to demonstrate that only a small amount of moisture dramatically affects the electrochemical reduction of NO3-, resulting in OH- generation close to the cathode and subsequent NiO(OH)/Ni(OH)(2) deposition, as proved by X-ray diffraction and X-ray photoelectron spectroscopy. This finding highlights the importance of aprotic ionic liquids in developing a general electrochemical route for metal oxide deposition without the formation of metal hydroxide species, thus avoiding the requirement for post-deposition annealing treatments. The versatility of the present deposition route as well as its impact in (opto)electronic devices was pointed out by the successful preparation of nanostructured n-p ZnO/NiO heterojunctions exhibiting rectifying current-voltage characteristics. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:261 / 267
页数:7
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