Effects of cation distribution on optical properties of Mn-Co-Ni-O films

被引:27
作者
Ma, Chao [1 ,2 ]
Ren, Wei [1 ]
Wang, Lei [1 ]
Bian, Liang [1 ]
Xu, Jin Bao [1 ]
Chang, Ai Min [1 ]
机构
[1] Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Xinjiang Key Lab Elect Informat Mat & Devices, Urumqi 830011, Peoples R China
[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
基金
中国科学院西部之光基金;
关键词
Thin films; Optical properties; Cation distribution; Absorption; THIN-FILMS; DEPENDENCE; THICKNESS;
D O I
10.1016/j.matlet.2015.04.046
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effects of cation distribution on optical properties of MnxCo2.52-xNi0.48O4 serial thin films are investigated by spectroscopic ellipsometry and Raman technique. The optical constants present a distinctive difference with the change of the cation distribution in the serial films. Three absorption structures are found in the dielectric constant spectra while their intensities strongly depend on the distribution of cations. Complementary Raman scattering measurements corroborate the varying absorptions are mainly contributed by Mn ions in high photon energy range but Co ions in low. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:162 / 164
页数:3
相关论文
共 15 条
  • [1] Charge-ordered insulating state of Fe3O4 from first-principles electronic structure calculations
    Anisimov, VI
    Elfimov, IS
    Hamada, N
    Terakura, K
    [J]. PHYSICAL REVIEW B, 1996, 54 (07): : 4387 - 4390
  • [2] Negative Temperature Coefficient Resistance (NTCR) Ceramic Thermistors: An Industrial Perspective
    Feteira, Antonio
    [J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2009, 92 (05) : 967 - 983
  • [3] Optical properties of Mn1.56Co0.96Ni0.48O4 films studied by spectroscopic ellipsometry
    Gao, Y. Q.
    Huang, Z. M.
    Hou, Y.
    Wu, J.
    Ge, Y. J.
    Chu, J. H.
    [J]. APPLIED PHYSICS LETTERS, 2009, 94 (01)
  • [4] Infrared optical properties of Mn1.56Co0.96Ni0.48O4 thin films prepared by chemical solution deposition
    Gao, Y. Q.
    Huang, Z. M.
    Hou, Y.
    Wu, J.
    Zhou, W.
    Zhang, L. B.
    Chu, J. H.
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2014, 114 (03): : 829 - 832
  • [5] Effects of thickness on the infrared optical properties of Ba0.9Sr0.1TiO3 ferroelectric thin films
    Hu, Z
    Wang, G
    Huang, Z
    Meng, X
    Zhao, Q
    Chu, J
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2004, 78 (05): : 757 - 760
  • [6] Thickness dependence of infrared optical properties of LaNiO3 thin films prepared on platinized silicon substrates
    Hu, ZG
    Meng, XJ
    Huang, ZM
    Wang, GS
    Zhao, Q
    Chu, JH
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (11): : 7045 - 7049
  • [7] Study of structural defects in γ-MnO2 by Raman spectroscopy
    Julien, C
    Massot, M
    Rangan, S
    Lemal, M
    Guyomard, D
    [J]. JOURNAL OF RAMAN SPECTROSCOPY, 2002, 33 (04) : 223 - 228
  • [8] Effects of nickel doping on structural and optical properties of spinel lithium manganate thin films
    Kim, Kwang Joo
    Lee, Jung Han
    [J]. SOLID STATE COMMUNICATIONS, 2007, 141 (02) : 99 - 103
  • [9] Preparation and properties of thermistor thin-films by metal organic decomposition
    Kukuruznyak, DA
    Bulkley, SA
    Omland, KA
    Ohuchi, FS
    Gregg, MC
    [J]. THIN SOLID FILMS, 2001, 385 (1-2) : 89 - 95
  • [10] Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry
    Ma, Chao
    Wang, Hong Guang
    Zhao, Peng Jun
    Xu, Jin Bao
    Chang, Ai Min
    Wang, Lei
    Bian, Liang
    [J]. MATERIALS LETTERS, 2014, 136 : 225 - 228