The early stages of Saccharomyces cerevisiae yeast suspensions damage in moderate pulsed electric fields

被引:34
作者
El Zakhem, H [1 ]
Lanoiseillé, JL [1 ]
Lebovka, NI [1 ]
Nonus, M [1 ]
Vorobiev, E [1 ]
机构
[1] Univ Technol Compiegne, UMR 6067, CNRS, Dept Chem Engn,Ctr Rech Royallieu, F-60205 Compiegne, France
关键词
Saccharomyces cerevisiae; PEF; conductivity;
D O I
10.1016/j.colsurfb.2005.12.010
中图分类号
Q6 [生物物理学];
学科分类号
071011 ;
摘要
The objectives of this study were to investigate the effects of pulsed electric fields (PEF) application to colloidal suspension of Saccharomyces cerevisiae. The electrical conductivity measurements during the PEF-treatment of S. cerevisiae suspensions were used to monitor the extent of cell damages in the intervals of electric field strength E = 3-15 kV/cm and time of PEF treatment t(PEF) = 10(-4) to 1s. At relatively small fields (E < 7.5 kV/cm) the early stages of yeast cells damages were observed. At such treatment conditions, the damage was incomplete and developed at long time of PEF treatment, below the value of E = 7.5 kV/cm which is commonly referred in literature as a threshold for this culture. Data obtained for the disintegration in conductivity experiments were found in good correlation with direct counting of yeast lethality using light microscopy. The PEF-induced lethality of the yeast cells and size flocs increased with the mixing of suspensions and the increase of temperature. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:189 / 197
页数:9
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