Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop

被引：547

作者：

Iveland, Justin ^{[1
]}

Martinelli, Lucio ^{[2
]}

Peretti, Jacques ^{[2
]}

Speck, James S. ^{[1
]}

Weisbuch, Claude ^{[1
,2
]}

机构：

[1] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA

[2] Ecole Polytech, Phys Mat Condensee Lab, CNRS, F-91128 Palaiseau, France

来源：

PHYSICAL REVIEW LETTERS | 2013年 / 110卷 / 17期

关键词：

ENERGY-DISTRIBUTION; PHOTOEMISSION; TRANSPORT; JUNCTIONS; SILICON; GAN;

D O I：

10.1103/PhysRevLett.110.177406

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report on the unambiguous detection of Auger electrons by electron emission spectroscopy from a cesiated InGaN/GaN light-emitting diode under electrical injection. Electron emission spectra were measured as a function of the current injected in the device. The appearance of high energy electron peaks simultaneously with an observed drop in electroluminescence efficiency shows that hot carriers are being generated in the active region (InGaN quantum wells) by an Auger process. A linear correlation was measured between the high energy emitted electron current and the "droop current"-the missing component of the injected current for light emission. We conclude that the droop phenomenon in GaN light-emitting diodes originates from the excitation of Auger processes. DOI: 10.1103/PhysRevLett.110.177406

引用

页数：5

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