DC and AC electrical characteristics of porous GaAs/p+-GaAs heterostructure

被引:18
作者
Beji, L [1 ]
Ben Jomaa, T [1 ]
Harrabi, Z [1 ]
Laribi, A [1 ]
Missaoui, A [1 ]
Bouazizi, A [1 ]
机构
[1] Fac Sci Monastir, Lab Phys & Chim Interfaces, Monastir 5019, Tunisia
关键词
porous GaAs; electrical measurements;
D O I
10.1016/j.vacuum.2005.08.024
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper reports on studying Au/porous GaAs/p(+)-GaAs heterostructure through current-voltage I (V), conductance- and capacitance-frequency dependencies (G (f) and C (f)). Diode parameters such as ideality factor and zero bias barrier energy have been calculated by using Schottky model corrected from the series resistance. The obtained ideality factor is generally high and it was explained by space charge limited current (SCLC) regime, characterised by the presence of single trapping level. A model based upon TFE tunnelling of carriers at reverse current was used to explain the non-saturation of reverse current after series resistance correction. The G (f) characteristics exhibit the presence of three frequency regions. In the first region the conductance is independent of frequency. Moreover, in the second region the AC conductance increases with increasing frequency and approximately follows omega(s) dependence. These results were interpreted as the result of the transport of injected carrier via hopping mechanism involving defect. In the third region a peak conductance appeared after which the conductance decreased with increasing frequency. C (f) measurements exhibit that the capacitance behaviour is typical of material with traps. From G (f) and C (f) measurement trap density and relaxation time were calculated. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:480 / 487
页数:8
相关论文
共 31 条
[1]   ELECTRONIC STATES OF SEMICONDUCTOR CLUSTERS - HOMOGENEOUS AND INHOMOGENEOUS BROADENING OF THE OPTICAL-SPECTRUM [J].
ALIVISATOS, AP ;
HARRIS, AL ;
LEVINOS, NJ ;
STEIGERWALD, ML ;
BRUS, LE .
JOURNAL OF CHEMICAL PHYSICS, 1988, 89 (07) :4001-4011
[2]  
[Anonymous], ELECT PROCESS NONCRY
[3]   Electrical properties of iron-silica nanocomposites synthesized by electrodeposition [J].
Banerjee, S ;
Ghosh, AK ;
Chakravorty, D .
JOURNAL OF APPLIED PHYSICS, 1999, 86 (12) :6835-6840
[4]   BAND ALIGNMENT AND CARRIER INJECTION AT THE POROUS-SILICON CRYSTALLINE-SILICON INTERFACE [J].
BENCHORIN, M ;
MOLLER, F ;
KOCH, F .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (09) :4482-4488
[5]   NONLINEAR ELECTRICAL-TRANSPORT IN POROUS SILICON [J].
BENCHORIN, M ;
MOLLER, F ;
KOCH, F .
PHYSICAL REVIEW B, 1994, 49 (04) :2981-2984
[6]   SEMICONDUCTING AND OTHER MAJOR PROPERTIES OF GALLIUM-ARSENIDE [J].
BLAKEMORE, JS .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (10) :R123-R181
[7]  
BLOOD P, TECHNIQUES PHYSICS, V14
[8]   SILICON QUANTUM WIRE ARRAY FABRICATION BY ELECTROCHEMICAL AND CHEMICAL DISSOLUTION OF WAFERS [J].
CANHAM, LT .
APPLIED PHYSICS LETTERS, 1990, 57 (10) :1046-1048
[9]   The DC characteristics of anisotype heterojunction in the presence of interface states and series resistance [J].
Chattopadhyay, P ;
Haldar, DP .
APPLIED SURFACE SCIENCE, 1999, 143 (1-4) :287-300
[10]   EXTRACTION OF SCHOTTKY DIODE PARAMETERS FROM FORWARD CURRENT-VOLTAGE CHARACTERISTICS [J].
CHEUNG, SK ;
CHEUNG, NW .
APPLIED PHYSICS LETTERS, 1986, 49 (02) :85-87