3rd order nonlinear optical properties of Au: SiO2 nanocomposite films with varying Au particle size
被引:27
作者:
Jun, H. -S.
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Jun, H. -S.
Lee, K. -S.
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Lee, K. -S.
Yoon, S. -H.
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Yoon, S. -H.
Lee, T. S.
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Lee, T. S.
Kim, I. H.
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Kim, I. H.
Jeong, J. -H.
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Jeong, J. -H.
Cheong, B.
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Cheong, B.
Kim, A. S.
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Kim, A. S.
Cho, K. M.
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Cho, K. M.
Kim, W. M.
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Kim, W. M.
机构:
[1] Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
[2] Sogang Univ, Dept Phys, Seoul 121742, South Korea
来源:
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
|
2006年
/
203卷
/
06期
关键词:
D O I:
10.1002/pssa.200566146
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Four Au:SiO2 composite films with varying Au particle size at fixed volume fraction were fabricated by alternate sputtering, and their 3rd order nonlinear optical properties were investigated by the z-scan technique using picosecond pulse laser. TEM analysis was used to estimate the particle size for samples with varying Au nominal thickness, and size dependent linear absorption spectra were examined. Particle size dependence on the imaginary part of 3rd order susceptibility at surface plasmon wavelength together with the dispersion of the real and the imaginary components around surface plasmon wavelength were resolved and compared with the theoretical values.
机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Cho, SH
;
Lee, S
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Lee, S
;
Ku, DY
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Ku, DY
;
Lee, TS
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h-index: 0
机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Lee, TS
;
Cheong, B
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Cheong, B
;
Kim, WM
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机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Kim, WM
;
Lee, KS
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机构:
Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South KoreaKorea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Cho, SH
;
Lee, S
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h-index: 0
机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Lee, S
;
Ku, DY
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h-index: 0
机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Ku, DY
;
Lee, TS
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h-index: 0
机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Lee, TS
;
Cheong, B
论文数: 0引用数: 0
h-index: 0
机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Cheong, B
;
Kim, WM
论文数: 0引用数: 0
h-index: 0
机构:Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea
Kim, WM
;
Lee, KS
论文数: 0引用数: 0
h-index: 0
机构:
Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South KoreaKorea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South Korea