Comparative performance studies of indium and gold-tin packaged diode laser bars

被引：11

作者：

Lorenzen, D ^{[1
]}

Schröder, M

Meusel, J

Hennig, P

König, H

Phihppens, M

Sebastian, J

Hülsewede, R

机构：

[1] JENOPT Laserdiode GmbH, Goschwitzer Str 29, D-07745 Jena, Germany

[2] OSRAM Opto Semicond GmbH, D-93055 Regensburg, Germany

[3] JENOPTIK Diode Lab GmbH, D-12489 Berlin, Germany

来源：

HIGH-POWER DIODE LASER TECHNOLOGY AND APPLICATIONS IV | 2006年 / 6104卷

关键词：

high-power; diode; laser; solder; indium; gold-tin; reliability; cw; puls; mode; performance; hard-pulse;

D O I：

10.1117/12.659047

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

This paper is mainly dedicated to a short-time scale reliability study of different packages applied to the same type of laser diode bars: indium and gold-fin packaged laser bars are operated in cw hard-pulse mode with increasing currents until their destruction. The destruction currents serve as guide values for long-time aging tests that should be performed at lower currents. Gold-tin packaged diode lasers turn out to have clearly higher destruction currents in hard-pulse mode. This result is underlined by long-time aging tests at appropriate currents.

引用

页数：12