Conductivity mechanisms in unintentionally doped GaN nanowires (NWs) are studied. Gated current-voltage measurements and threshold voltage modeling demonstrate the unique impact of device parameters on NW field-effect transistors as compared to conventional systems. Temperature-dependent resistivity results, acquired with a scanning tunneling microscope equipped with multiple tips, reveal only mild temperature dependence at higher temperatures, with temperature-independent resistivity observed below similar to 100 K indicating impurity band conduction. The likely origins and implications of these results are discussed.
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Virginia Commonwealth Univ, Dept Phys, Med Coll Virginia Campus, Richmond, VA 23284 USAVirginia Commonwealth Univ, Dept Phys, Med Coll Virginia Campus, Richmond, VA 23284 USA
Cerovski, V
Rao, BK
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机构:Virginia Commonwealth Univ, Dept Phys, Med Coll Virginia Campus, Richmond, VA 23284 USA
Rao, BK
Khanna, SN
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机构:Virginia Commonwealth Univ, Dept Phys, Med Coll Virginia Campus, Richmond, VA 23284 USA
Khanna, SN
Jena, P
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机构:Virginia Commonwealth Univ, Dept Phys, Med Coll Virginia Campus, Richmond, VA 23284 USA
Jena, P
Ishii, S
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机构:Virginia Commonwealth Univ, Dept Phys, Med Coll Virginia Campus, Richmond, VA 23284 USA
Ishii, S
Ohno, K
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机构:Virginia Commonwealth Univ, Dept Phys, Med Coll Virginia Campus, Richmond, VA 23284 USA
Ohno, K
Kawazoe, Y
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机构:Virginia Commonwealth Univ, Dept Phys, Med Coll Virginia Campus, Richmond, VA 23284 USA