Alternating current techniques in scanning electrochemical microscopy (AC-SECM)

被引:101
作者
Eckhard, Kathrin [1 ]
Schuhmann, Wolfgang [1 ]
机构
[1] Ruhr Univ Bochum, D-44780 Bochum, Germany
关键词
D O I
10.1039/b806721j
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Alternating current scanning electrochemical microscopy (AC-SECM) is a growing branch within the variety of SECM methods. This review covers publications involving AC-SECM from its beginning to date. The findings of several research groups are thematically structured along with the specific experimental procedures. This should enable researchers to rationally choose purposeful parameters for their AC-SECM experiments.
引用
收藏
页码:1486 / 1497
页数:12
相关论文
共 57 条
[1]   Impedance feedback control for scanning electrochemical microscopy [J].
Alpuche-Aviles, MA ;
Wipf, DO .
ANALYTICAL CHEMISTRY, 2001, 73 (20) :4873-4881
[2]   Biological applications of scanning electrochemical microscopy: chemical imaging of single living cells and beyond [J].
Amemiya, Shigeru ;
Guo, Jidong ;
Xiong, Hui ;
Gross, Darrick A. .
ANALYTICAL AND BIOANALYTICAL CHEMISTRY, 2006, 386 (03) :458-471
[3]   Application of AC impedance techniques to Scanning Electrochemical Microscopy [J].
Baranski, AS ;
Diakowski, PM .
JOURNAL OF SOLID STATE ELECTROCHEMISTRY, 2004, 8 (10) :683-692
[4]   SCANNING ELECTROCHEMICAL MICROSCOPY - INTRODUCTION AND PRINCIPLES [J].
BARD, AJ ;
FAN, FRF ;
KWAK, J ;
LEV, O .
ANALYTICAL CHEMISTRY, 1989, 61 (02) :132-138
[5]   SCANNING ELECTROCHEMICAL MICROSCOPY - A NEW TECHNIQUE FOR THE CHARACTERIZATION AND MODIFICATION OF SURFACES [J].
BARD, AJ ;
DENUAULT, G ;
LEE, C ;
MANDLER, D ;
WIPF, DO .
ACCOUNTS OF CHEMICAL RESEARCH, 1990, 23 (11) :357-363
[6]   Scanning electrochemical microscopy: beyond the solid/liquid interface [J].
Barker, AL ;
Gonsalves, M ;
Macpherson, JV ;
Slevin, CJ ;
Unwin, PR .
ANALYTICA CHIMICA ACTA, 1999, 385 (1-3) :223-240
[7]   Alternating current scanning electrochemical microscopy (AC-SECM) studies on the surface of electrochemically polished NiTi shape memory alloys [J].
Belger, S ;
Schulte, A ;
Hessing, C ;
Pohl, M ;
Schuhmann, W .
MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK, 2004, 35 (05) :276-279
[8]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[9]   Local potential measurements with the SKPFM on aluminium alloys [J].
de Wit, JHW .
ELECTROCHIMICA ACTA, 2004, 49 (17-18) :2841-2850
[10]   Novel strategy for constant-distance imaging using alternating current scanning electrochemical microscopy [J].
Diakowski, Piotr M. ;
Ding, Zhifeng .
ELECTROCHEMISTRY COMMUNICATIONS, 2007, 9 (10) :2617-2621