Improved low-temperature environmental degradation of yttria-stabilized tetragonal zirconia polycrystals by surface encapsulation

被引:0
作者
Koh, YH [1 ]
Kong, YM [1 ]
Kim, S [1 ]
Kim, HE [1 ]
机构
[1] Seoul Natl Univ, Sch Mat Sci & Engn, Ctr Microstruct Sci Mat, Seoul 151742, South Korea
关键词
D O I
10.1111/j.1151-2916.1999.tb01940.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
An encapsulating layer was deposited on the surface of tetragonal zirconia polycrystals doped with 3 mol% of yttria (3Y-TZP), to prevent low-temperature environmental degradation (aging) of the material. The Iayer,which was composed of silica and zircon, was formed on the surface by exposing the specimens next to a bed of silicon carbide powder in a flowing hydrogen atmosphere that contained similar to 0.1% water vapor at 1450 degrees C. The layer was similar to 0.5 mu m thick and is expected to be under strong residual compressive stress. This encapsulation process remarkably improved the low-temperature degradation of the material. The strength of the specimens also was improved by this process.
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页码:1456 / 1458
页数:3
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