Scanning near-field optical microscope with a superfluorescent source

被引：0

作者：

Zhang, GP ^{[1
]}

Ming, H ^{[1
]}

Xie, JP ^{[1
]}

机构：

[1] Cent China Normal Univ, Dept Phys, Wuhan 430079, Peoples R China

来源：

OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN'99) | 1999年 / 3740卷

关键词：

near-field optics; microscope; scanning near-field optical microscope; fiber probe; superfluorescence;

D O I：

10.1117/12.347830

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A superfluorescent source used for scanning near-field optical microscope (SNOM) has been developed in this paper. The superfluorescent source originates from an amplified spontaneous emission (ASE) produced by an Er-doped fiber, with a relatively wide spectrum from 1531nm to 1537nm. This kind of superfluorescent fiber probe has relatively high photon flux over an ordinary probe. Different image qualities are obtained by the SNOM system with the superfluorescent source and the laser source respectively. Experimental result shows that the coherent noise of the SNOM image is dramatically reduced with the superfluorescent source.

引用

页码：331 / 334

页数：4

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